Diabetes 56:2643-2648, 2007 DOI: 10.2337/db06-1023 © 2007 by the American Diabetes Association
A Genome-Wide Linkage Scan of Insulin Level–Derived TraitsThe Amish Family Diabetes Study
1 Department of Medicine, School of Medicine, University of California, San Francisco, California Address correspondence and reprint requests to Wen-Chi Hsueh, MPH, PhD, 2200 Post St., C433, San Francisco, CA 94143-1640. E-mail: wen-chi.hsueh{at}ucsf.edu
Abbreviations:
AUC, area under the curve; HOMA-IR, homeostasis model assessment of insulin resistance; IFG, impaired fasting glucose; IGT, impaired glucose tolerance; OGTT, oral glucose tolerance test; STR, short tandem repeat
OBJECTIVE—Serum insulin levels are altered in insulin resistance and insulin deficiency, states that are associated with the development of type 2 diabetes. The goal of our study was to identify chromosomal regions that are likely to harbor genetic determinants of these traits. RESEARCH DESIGN AND METHODS—We conducted a series of genetic analyses, including genome-wide and fine-mapping linkage studies, based on insulin levels measured during an oral glucose tolerance test (OGTT) in 552 nondiabetic participants in the Amish Family Diabetes Study. Indices of insulin secretion included the insulinogenic index and insulin at 30 min postglucose load (insulin 30), while indices of insulin resistance included homeostasis model assessment of insulin resistance (HOMA-IR) and fasting insulin. Insulin area under the curve, a measure of both insulin secretion and insulin resistance, was also examined.
RESULTS—All traits were modestly heritable, with heritability estimates ranging from 0.1 to 0.4 (all P < 0.05). There was significant genetic correlation between fasting insulin and HOMA-IR ( CONCLUSIONS—These results suggest that there may be different genes influencing variation in OGTT measures of insulin secretion and insulin resistance.
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