DOI: 10.2337/db06-1023
A Genome-Wide Linkage Scan of Insulin Level Derived Traits: the Amish Family Diabetes Study
1 Department of Medicine, School of Medicine, University of California, San Francisco, CA Correspondence: wen-chi.hsueh{at}ucsf.edu Objective:Serum insulin levels are altered in insulin resistance and insulin deficiency, states associated with development of type 2 diabetes. The goal of our study was to identify chromosomal regions likely to harbor genetic determinants of these traits. Research Design and Methods:We conducted a series of genetic analyses, including genome-wide and fine-mapping linkage studies, based on insulin levels measured during an oral glucose tolerance test (OGTT) in 552 non-diabetic participants in the Amish Family Diabetes Study. Indices of insulin secretion included the insulinogenic index and insulin at 30 minutes post-glucose load (insulin 30), while indices of insulin resistance included HOMA-IR and fasting insulin. Insulin area under the curve (AUC), a measure of both insulin secretion and insulin resistance, was also examined.
Results:All traits were modestly heritable, with heritability estimates ranging from 0.1-0.4 (all p < 0.05). There was significant genetic correlation between fasting insulin and HOMA-IR ( Conclusions:These results suggest that there may be different genes influencing variation in OGTT measures of insulin secretion and insulin resistance.
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